●Revolving nosepiece model with multiple objective lems for versatle use.
●Combination of microscope revolving nosepiece (manual and motorized) enables observation at low to high magnifications.
●The compact design allows for easy integration into inspection equipment.
Customer voices
Semiconductor inspection equipment manufacture B
High-perfomance autofocus system are essentiial for wafer inspection equipment.
*AutoFocusSystem catalog (Published November 2024, English) is download from
here. PDF download, approx. 9 megabytes. (Opens in a new window).
*Autofocus catalog (Published August 2020, old version, both English and Japanese) is download from
here. PDF download, approx. 9 megabytes. (Opens in a new window).